Hệ thống sourcemeter Keithley 2612B Dual-channel

Hệ thống sourcemeter để bàn Keithley 2612B Dual-channel System SourceMeter Instrument (200V, 10A Pulse)

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The Series 2600B System SourceMeter SMU Instruments are the industry’s leading current/voltage source and measure solutions, and are built from Keithley’s 3rd generation SMU technology. The Series 2600B offers single- and dual-channel models that combine the capabilities of a Precision Power Supply, true Current Source, 6-1/2 digit DMM, Arbitrary Waveform Generator, Pulse Generator, and Electronic Load – all into one tightly integrated instrument. The result is a powerful solution that significantly boosts productivity in applications ranging from bench-top I/V characterization through highly-automated production test. For bench-top use, Series 2600B instruments feature built-in, Java-based software that enables plug & play I/V testing through any browser, on any computer, from anywhere in the world. For automated system applications, the Series 2600B’s Test Script Processor (TSP) runs complete test programs from inside the instrument for industry-best through-put. In larger, multi-channel applications, Keithley’s TSP-Link technology works together with TSP to enable high-speed, SMU-per-pin parallel testing. Because Series 2600B SourceMeter SMU Instruments have fully isolated channels that do not require a mainframe, they can be easily re-configured and re-deployed as your test applications evolve.

Java-based Plug & Play I/V Test Software

The Series 2600B are the only SMU instruments to feature built-in, Java-based test software that enables true plug & play I/V characterization through any browser, on any computer, from anywhere in the world. This unique capability boosts productivity across a wide range of applications such as R&D, education, QA/FA, and more. Simply connect the 2600B to the internet via the supplied LAN cable, open a browser, type in the 2600B’s I.P. address, and begin testing. Resulting data can be downloaded to a spreadsheet such as Excel for further analysis and formatting, or for inclusion in other documents or presentations.

Unmatched Throughput for Automated Test with TSP Technology

All channels in the TSP-Link
system are synch ronized to under 500ns.

For test applications that demand the highest levels of automation and throughput, the Model 2600B’s TSP technology delivers industry-best performance.  TSP technology goes far beyond traditional test command sequencers… it fully embeds then executes complete test programs from within the SMU instrument itself.  This virtually eliminates all the time-consuming bus communications to and from the PC controller, and thus dramatically improves overall test times.

Model 2400 Software Emulation

TSP technology executes complete
test programs from the
2600B’s non-volatile memory.

The Series 2600B is compatible with test code developed for Keithley’s Model 2400 SourceMeter SMU instrument. This enables an easier upgrade from Model 2400-based test systems to Series 2600B, and can improve test speeds by as much as 80%. In addition, it provides a migration path from SCPI programming to Keithley’s TSP technology, which when implemented can improve test times even more. For complete support of legacy test systems, the Model 2400’s Source-Memory-List test sequencer is also fully supported in this mode.

SMU-Per-Pin Parallel Testing with TSP-Link Technology

TSP-Link is a channel expansion bus that enables multiple Series 2600B’s to be inter-connected and function as a single, tightly-synchronized, multi-channel system.  The 2600B’s TSP-Link technology works together with its’ TSP technology to enable high-speed, SMU-per-pin parallel testing. Unlike other high-speed solutions such as large ATE systems, the 2600B achieves parallel test performance without the cost or burden of a mainframe.  The TSP-Link based system also enables superior flexibility, allowing for quick and easy system re-configuration as test requirements change.

Third-generation SMU Instrument Design Ensures Faster Test Times

Based on the proven architecture of earlier Series 2600 instruments, the Series 2600B’s SMU instrument design enhances test speed in several ways. For example, while earlier designs used a parallel current ranging topology, the Series 2600B uses a patented series ranging  topology, which provides faster and smoother range  changes and outputs that settle more quickly.

SMU-Per-Pin Parallel Testing using TSP and TSP-Link improves test throughput and lowers the cost of test.

The Series 2600B SMU instrument design supports two modes of operation for use with a variety of loads. In normal mode, the SMU instrument provides high bandwidth performance for maximum throughput. In high capacitance (high-C) mode, the SMU instrument uses a slower bandwidth to provide robust performance with higher capacitive loads.

Simplify Semiconductor Component Test, Verification, and Analysis

The optional ACS Basic Edition software maximizes the productivity of customers who perform packaged part characterization during development, quality verification, or failure analysis. Key features include:

• Rich set of easy-to-access test libraries
• Script editor for fast customization of existing tests
• Data tool for comparing results quickly
• Formulator tool that analyzes captured curves and provides a wide range of math functions

For more information about the ACS Basic Edition software, please refer to the ACS Basic Edition data sheet.

Powerful Software Tools

In addition to the embedded Java-based plug & play software and optional ACS Basic Edition software, the free Test Script Builder software tool is provided to help users create, modify, debug, and store TSP test scripts. Table 1 describes key features of Series 2600B software tools.

Table 1. Series 2600B software tools

When you need to acquire data on a packaged part quickly, the wizard-based user interface of ACS Basic Edition makes it easy to find and run the test you want, like this common FET curve trace test.

Three new dual-channel bench-top models of Series 2600B offer industry-best value and performance.

For applications that do not require leading-edge system-level automation capabilities, Keithley has expanded the 2600B series to include 3 new value-priced “bench-top” models – the 2604B, 2614B, and 2634B.  These models offer similar performance to Models 2602B, 2612B, and 2636B, respectively, however do not include TSP-Link, Contact Check, and Digital I/O capabilities.

Complete Automated System Solutions

Keithley’s S500 Integrated Test Systems are highly configurable, instrument-based systems for semiconductor characterization at the device, wafer, or cassette level. Built on our proven Series 2600 System SourceMeter SMU instruments, our S500 Integrated Test Systems provide innovative measurement features and system flexibility, scalable to your needs. The unique measurement capability, combined with the powerful and flexible Automated Characterization Suite (ACS) software, provides a comprehensive range of applications and features not offered on other comparable systems on the market.

In the first and third quadrants, Series 2600B instruments operate as a source, delivering power to a load. In the second and fourth quadrants, they operate as a sink, dissipating power internally.

Models 2601B, 2602B, and 2604B I-V capability

Models 2611B, 2612B, and 2614B I-V capability

Models 2634B, 2635B, and 2636B I-V capability

TYPICAL APPLICATIONS

I-V functional test and characterization of a wide range of devices, including: Discrete and passive components Two-leaded – Sensors, disk drive heads, metal oxide varistors (MOVs), diodes, zener diodes, sensors, capacitors, thermistors Three-leaded – Small signal bipolar junction transistors (BJTs), field-effect transistors (FETs), and more Simple ICs – Optos, drivers, switches, sensors, converters, regulators Integrated devices – small scale integrated (SSI) and large scale integrated (LSI) Analog ICs Radio frequency integrated circuits (RFICs) Application specific integrated circuits (ASICs) System on a chip (SOC) devices Optoelectronic devices such as light-emitting diodes (LEDs), laser diodes, high brightness LEDs (HBLEDs), vertical cavity surface-emitting lasers (VCSELs), displays Wafer level reliability NBTI, TDDB, HCI, electromigration Solar Cells Batteries And more...