Semiconductor C-V Analyzer TongHui TH513
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Head Office: Ho Chi Minh City
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Features
• 10.1-inch capacitive touch screen, resolution 1280*800, Linux system
• Dual CPU architecture, the fastest test speed of LCR function is 0.56ms
• Three test methods: spot test, list scan, and graphic scan (option)
• Four parasitic parameters (Ciss, Coss, Crss, Rg) are measured and displayed on the same screen
• CV curve scan, Ciss-Rg curve scan
• Integrated design: LCR + VGS low voltage source + VDS high voltage source + channel switching + PC
• Standard 2-channel test, which can test two devices or dual-chip devices at the same time, the channel can be expanded to 6, channel parameters are stored separately
• Fast charging, shortens capacitor charging time and enables fast testing
• Automatic delay setting
• High Bias: VGS: 0 - ±40V, VDS: 0 - 200V/1500V/3000V
• 10 bin sorting
Applications
• Semiconductor components/Power components
Parasitic capacitance test and C-V characteristic analysis of diodes, triodes, MOSFETs, IGBTs, thyristors, integrated circuits, optoelectronic chips, etc.
• Semiconductor material
Wafer, C-V characteristic analysis
• Liquid crystal material
Elastic constant analysis
• Capacitive element
Capacitor C-V characteristic test and analysis, capacitive sensor test and analysis
Accessories
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