TH2829AX-48 Automatic Transformer Test System 48 pin

TH2829AX-48 Automatic Transformer Test System 48 pin

SKU:
TH2829AX-48
Brand:
Warranty:
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Price: Contact
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Specification

Test Pin(PIN): 48 

Test Frequency: 20Hz — 200kHz 

Display: 800×RGB×480  7 inch TFT LCD display 

LCR Function: option 

Transformer test parameters: Turn Ratio, Turns, Phase, L, C, Lk, Q, ACR, DCR, Balance, Pin Short, Diode P/N 

LCR Test Parameters: |Z|,Y|, C, L, X, B, R, G, D, Q, θ, DCR, Turn-Ratio, Phase, Lk 

Basic Test Accuracy: 
LCRZ: 0.05%
DCR、Turn Ratio: 0.1%

Signal Source Output Impedance: 10Ω、30Ω、50Ω、100Ω

Test Speed (ms/times): 13ms, 90 ms, 370 ms

AC Signal Level: 5mVrms — 2Vrms(transformer test, can be customized to 10Vrms), 5mVrms — 10Vrms(LCR function);50μArms — 100mArms

DC Bias Current Source: 0 — ±1A option(option TH2901) / 0 — ±2A option(option TH2902)

DC Constant Current Source: 0mA – ±120mA for diode forward characteristic test

Diode Test: 
forward test voltage: 0 — 9.9999 V
Reverse test current: 0 — 99.999 mA

Comparator: 10 bins, PASS/FAIL indication, file counting function

Storage: Internal: 100 sets of configuration file;U disk: 500 sets of configuration files, CSV format test data, GIF format images

Application

■ Switching transformer scanning test, comprehensive characteristics analysis. 
■ Network transformer scanning test, comprehensive characteristics analysis 
■ Discrete passive components (L, R, C) multi-channel scanning test 
■ Relay drive line package, contact resistance multi-channel scanning test 
■ Multi-channel DC resistance DCR scanning test 
■ Comprehensive test analysis of multiple passive components in impedance network

Máy phân tích biến tần TongHui TH 2
Máy phân tích biến tần TongHui TH 1

Performance characteristics

– Number of test PIN: 48 
– Frequency: 20Hz – 200khz, Resolution: 0.5mHz 
– Signal level: 5mV-2Vrms (Option: 2mV-10Vrms) 
– Test Speed: max. 13ms 
– 7-inch TFT LCD display with a resolution of 800xRGBx480 
– Built-in-0-100mA/0-10V bias power supply, optional 1A/2A bias current source 
– Diode forward and reverse characteristic detection 
– Improved high turns ratio and wekly coupled transformer test capability 
– Improved DCR testing capabilities 
– Single screen can accommodate all scan test results 
– Sort the selected scanning parameters 
– Time stamping system: memory file setting, calibration deviation and deduction time 
– Self-test scanning fixture relays 
– Flexible deviation deduction method 
– Multiple handling ways for FAIL cases 
– Single parameter test cycle to test independent windings 
– Incresed security: administrator and opertor passwords 
– Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc 
– Bar-code reading function can be used to select a setting file or to manage the typr of test products 
– Optional PC-level instrument test setup file programming capability 
– Online upgrade mode: USB HOST or RS232 
– Support multiple instrument networking through LAN interface 
– Backward compatible with TH2818X/TH2819X parameter setting file 
– Storage: Internal: 100 groups of settings file to save U disk: 500 groups of configuration files, CSV format test data, GIF format images

Accessories

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