TH2829NX Automatic Transformer Test System 192 pin

Name: TH2829NX Automatic Transformer Test System 192 pin
Brand: Tonghui
SKU: TH2829NX
Price: 0,00USD USD
Availability: InStock
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SKU:

TH2829NX

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Tonghui

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Specification

Test Pin(PIN): 72/96/120/144/168/192

Test Frequency: 20Hz — 200kHz

Display: 800×RGB×480 7 inch TFT LCD display

LCR Function: option

Transformer test parameters: Turn Ratio, Turns, Phase, L, C, Lk, Q, ACR, DCR, Balance, Pin Short, Diode P/N

LCR Test Parameters: |Z|,Y|, C, L, X, B, R, G, D, Q, θ, DCR, Turn-Ratio, Phase, Lk

Basic Test Accuracy:
LCRZ: 0.05%
DCR、Turn Ratio: 0.1%

Signal Source Output Impedance: 10Ω、30Ω、50Ω、100Ω

Test Speed (ms/times): 13ms, 90 ms, 370 ms

AC Signal Level: 5mVrms — 2Vrms(transformer test, can be customized to 10Vrms), 5mVrms — 10Vrms(LCR function)；50μArms — 100mArms

DC Bias Current Source: 0 — ±1A option(option TH2901) / 0 — ±2A option(option TH2902)

DC Constant Current Source: 0mA – ±120mA for diode forward characteristic test

Diode Test:
forward test voltage: 0 — 9.9999 V
Reverse test current: 0 — 99.999 mA

Comparator: 10 bins, PASS/FAIL indication, file counting function

Storage: Internal: 100 sets of configuration file;U disk: 500 sets of configuration files, CSV format test data, GIF format images

Description product
Accessories

Application

■ Switching transformer scanning test, comprehensive characteristics analysis.
■ Network transformer scanning test, comprehensive characteristics analysis
■ Discrete passive components (L, R, C) multi-channel scanning test
■ Relay drive line package, contact resistance multi-channel scanning test
■ Multi-channel DC resistance DCR scanning test
■ Comprehensive test analysis of multiple passive components in impedance network

Performance characteristics

– Number of test PIN: 72/96/120/144/168/192
– Frequency: 20Hz – 200khz, Resolution: 0.5mHz
– Signal level: 5mV-2Vrms (Option: 2mV-10Vrms)
– Test Speed: max. 13ms
– 7-inch TFT LCD display with a resolution of 800xRGBx480
– Built-in-0-100mA/0-10V bias power supply, optional 1A/2A bias current source
– Diode forward and reverse characteristic detection
– Improved high turns ratio and wekly coupled transformer test capability
– Improved DCR testing capabilities
– Single screen can accommodate all scan test results
– Sort the selected scanning parameters
– Time stamping system: memory file setting, calibration deviation and deduction time
– Self-test scanning fixture relays
– Flexible deviation deduction method
– Multiple handling ways for FAIL cases
– Single parameter test cycle to test independent windings
– Incresed security: administrator and opertor passwords
– Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc
– Bar-code reading function can be used to select a setting file or to manage the typr of test products
– Optional PC-level instrument test setup file programming capability
– Online upgrade mode: USB HOST or RS232
– Support multiple instrument networking through LAN interface
– Backward compatible with TH2818X/TH2819X parameter setting file
– Storage: Internal: 100 groups of settings file to save U disk: 500 groups of configuration files, CSV format test data, GIF format images