Impedance Analyzer Tonghui TH2848-02 2MHz

Name: Impedance Analyzer Tonghui TH2848-02 2MHz
Brand: Tonghui
SKU: TH2848-02
Availability: InStock
Rating: 5.00 (1 reviews)

Model:

TH2848-02

Origin:

China

Manufacturer:

Tonghui

Price: Contact

Available: Please contact

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Hotline: +84 906 988 447

Head Office: Ho Chi Minh City

Tel: +84 2839 778 269 / 3601 6797
Email: [email protected]
Add: 487 Cong Hoa Street, Tan Binh Ward, Ho Chi Minh City, Vietnam

Office: Bac Ninh City

Tel: +84 222 730 0180
Email: [email protected]
Add: 184 Binh Than Street, Vo Cuong Ward, Bac Ninh, Vietnam

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Specification

Data is being updated

Description product
Accessories

Features TH2848-02L

■ High resolution: 10.1 inches, resolution 1280*800,capacitive touch screen

■High precision: automatic balanced bridge technology, four-end pair test configuration

■ High stability and consistency: 15 range configurations

■ High power: Signal level: 20VAC /100mAAC Built-in DC bias: ±40VDC /100mADC

■ High speed: dual CPU architecture, the fastest test speed up to 400 times / s (2.5ms)

■ Convenient operation: Linux operating base, touch operation, embedded help

■ Three types of tests: spot test, list scan, and graphic scan

■ Four-parameter measurement

■ One-click recording, one-click screenshot

■ 201-point multi-parameter list scanning function

■ Graphic scanning function, 4 tracks at will, support 1/2/4 split screen

■ Piezoelectric conductivity circle test, dielectric constant test

■ Powerful sorting: LCR mode: 10levels of sorting Graphical analysis mode: support curve condition sorting

■ High compatibility: supports SCPI/MODBUS command set. Compatible with KEYSIGHT E4980A, E4980AL, HP4284A

■ Independent 24V cylinder control

Applications TH2848-02L

■ Passive components

Evaluation of impedance parameters and performance analysis of capacitors, inductors, cores, resistors, piezoelectric devices, transformers, chip assemblies, crystals, and network components.

■ Semiconductor component

Parasitic parameter testing and analysis of LED driver integrated circuits; C-VDC characterization of varactor diodes; parasitic parameter analysis of transistors or integrated circuits

■ Other components

Impedance evaluation of printed circuit boards, relays, switches, cables, batteries, etc.

■ Medium Material

Evaluation of dielectric constants and loss angles of plastics, ceramics and other materials.

■ Magnetic material

Evaluation of permeability and loss angle of ferrites, amorphous and other magnetic materials

■ Semiconductor materials

Dielectric constant, electrical conductivity and C-V properties of semiconductor materials

■ Liquid crystal materials

C-V characteristics such as dielectric constant and elasticity constant of liquid crystal units

■ Piezoelectric materials and devices

Piezo Ceramic Filters, Piezo Ceramic Trap, Piezo Ceramic Discriminator, Piezo Ceramic Transformer, High Power Ultrasonic Generator, Transducer (Oscillator), Surface acoustic wave devices, electroacoustic devices, etc. can be tested such as static capacitance, loss, resonance frequency, anti-resonance frequency, mechanical coupling coefficient and other parameters.

Specifications

Product Model		TH2848-02L	TH2848-02	TH2848-05	TH2848-10
Display	Monitor	10.1-inch (diagonal) capacitive touch screen
	Scale	16:9
	Resolution	1280×RGB×800
Measured Parameters	Methods	Four parameters can be selected arbitrarily
	AC	Cp,Cs,Lp,Ls,Rp,Rs,\|Z\|,\|Y\|,R,X,G,B,θ,D,Q,VAC,IAC,
	DC	RDC
	Piezoelectricity	Ct,Dt,Fs,Fp,Fp-Fs,Zmin,Zmax,F1,F2,F2-F1,Gmax,C0,C1,R1,L,Kp,Keff,Kt,K31,K33,Qm,ε,εr
	Dielectric	Cp,D,ε,\|ε\|,εr',εr'',tanδ,Q
Test Frequency	Range	4Hz-2MHz	4Hz-2MHz	4Hz-5MHz	4Hz-10MHz
	Accuracy	0.01%
	Resolution	0.1mHz 4.0000Hz-99.9999Hz
		1mHz 100.000Hz-999.999Hz
		10mHz 1.00000kHz-9.99999kHz
		100mHz 10.0000kHz-99.9999kHz
		1Hz 100.000kHz-999.999kHz
		10Hz 1.00000MHz-9.99999MHz
AC Test Signal Mode	Rating Value (ALC OFF)	The set voltage is the Hcur voltage when the test terminal is open-circuit. The set current is the current from Hcur when the test terminal is short-circuited.
	Constant Value(ALC ON)	Keep the voltage on the DUT the same as the set value Keep the current on the DUT the same as the set value
Test level	Voltage range	0Vrms - 2Vrms	0mVrms-20Vrms F<=1MHz
			0mVrms-15Vrms 1MHz<F<=2MHz
			0mVrms-2Vrms 2MHz<F<=MHz
			0mVrms-1Vrms 5MHz<F<=10MHz
	Accuracy	±(10%×set value+2mV)(AC<=Vrms)
		±(10%×set value+5mV)(AC＞2Vrms)
	Resolution	0.1mVrms 0mVrms-0.2Vrms
		0.2mVrms 0.2Vrms-0.5Vrms
		0.5mVrms 0.5Vrms-1Vrms
		1mVrms 1Vrms-10Vrms
		10mVrms 10Vrms-20Vrms
	Current range	0mArms-20mArms	0mArms-100mArms
	Resolution (100Ω internal resistance)	1μArms 0Arms-2mArms
		2μArms 2mArms-5mArms
		5μArms 5mArms-10mArms
		10μArms 10mArms-100mArms
RDC test	Voltage range	100mV-1V
	Resolution	100μV
	Current range	0mA-10mA
	Resolution	10μA
DC Bias	voltage range	0V-±10V	0V-±40V
	Accuracy	1%×set voltage+5mV AC<=2V
		2%×set voltage+8mV AC>2V
	Resolution	0.1mV 0V - ±5V
		1mV ±5V - ±40V
	Current range	0mA - ±100mA
	Resolution	1μA 0mA-50mA
		10μA 50mA-100mA
Voltage source	voltage range	-10V - 10V
	Resolution	1mV
	Current range	-45mA - +45mA
	Output Impedance	100Ω
Cylinder control	Switching control
	Turn on	Turns on within the set time from 0-60s
	Turn off	Turns off within the set time from 0-60s
Test Side Configuration		Four-terminal pair
Test cable length		0m,1m
Output Impedance		100Ω，±1%@1kHz
Mathematical operation		Absolute deviation Δ from nominal value, percentage deviation Δ% from nominal value
Equivalence mode		Series, parallel
Calibration function		OPEN,SHORT,LOAD
Measured average		1-255 times
Range Selection		AUTO,HOLD
Trigger Mode		Continuous, single
Trigger delay		0-60s
specific function		One-click screenshot, one-click record, embedded help system
Range Configurat	LCR	100mΩ,1Ω,10Ω,20Ω,50Ω,100Ω,200Ω,500Ω,1kΩ,2kΩ,5kΩ,10kΩ,20kΩ,50kΩ,100kΩ
	RDC	10Ω,20Ω,50Ω,100Ω,200Ω,500Ω,1kΩ,2kΩ,5kΩ,10kΩ,20kΩ,50kΩ,100kΩ
Measuring time (ms/time) (Frequency >= 100kHz)		Fast: 2.5ms Medium: 90ms Slow: 220ms
Maximum accuracy		0.05%(refer to specifications)
Measurement display range
Cs,Cp		0.00001pF - 9.99999F
Ls,Lp		0.00001μH - 99.9999kH
D		0.00001 - 9.99999
Q		0.00001 - 99999.9
R,Rs,Rp,X,Z,RDC		0.001mΩ - 99.9999MΩ
G,B,Y		0.00001μs - 99.9999S
VDC		±0V - ±999.9999V
IDC		±0A - ±999.9999A
θr		-6.28318
θd		-179.999° - 179.999°
Δ%		±(0.000% - 999.9%)
Multifunction parameter list scanning	Points	201 points, average can be set for each point, each point can be sorted individually
	Parameters	Test frequency, AC voltage, AC current, DC BIAS voltage, DC BIAS current, with dielectric constant test function based on the parameter of each point in this list
	Trigger Mode	Sequential SEQ: When triggered once, measurements are taken at all scan points, /EOM/INDEX is output only once Step STEP: performs one scan point measurement per trigger, outputs /EOM/INDEX for each point, but list scan comparator result is only output at the last /EOM
	Other features	1.Multiple copy functions for both scanning and test parameters 2.Time delay can be set for each scanning point
	Dielectric constant	Dielectric Material Testing Solutions
	Comparator	Each scanning point can measure up to four test parameters, each parameter can be set upper and lower limits, all test parameters are qualified to output PASS signal, otherwise output FAIL signal, no judgment if no upper and lower limits are set.
Graphic Scanning	Scanning Points	Points 51, 101, 201, 401, 801 are optional
	Results Display	Extreme values for each parameter and the scanned parameter value at the point where the cursor is located with the corresponding test parameter value
	Piezoelectric testing	Piezoelectric device and piezoelectric material testing solutions, integrated piezoelectric admittance circle function
	Scanning track	1-4 test parameters can be selected arbitrarily, and the scanning curve can be divided into one screen, two screens and four screens.
	Display range	Real-time automatic, locked
	Coordinate scale	Logarithmic, linear
	Scanning parameters	Frequency, AC Voltage, AC Current, DCV BIAS/DCI BIAS
	Trigger method, Single	Trigger manually once, one scan from start to finish is completed, the next trigger signal starts a new scan
	Trigger method, Sequential	Infinite loop scanning from start to finish
	Results Saving	Graphics, documentation
Comparator	Bin Staging	10Bin,PASS,FAIL
	Bin deviation setting	Deviation value, percent deviation value, off
	Bin mode	Tolerance, continuous
	Bin Count	0-99999
	BIN Judgement	Up to four parameters can be set for the limit range. If the results of the four test parameters fall within the set range, the corresponding BIN number is displayed. If it exceeds the maximum BIN number range set, it displays FAIL. Test parameters without upper and lower limits set will be automatically ignored for BIN judgement.
	PASS/FAIL Indication	If it meets Bin1-10 criteria, the PASS light on the front panel lights up; otherwise, the FAIL light is illuminated.
Data Cache		201 measurement results can be batch-read.
Storage	Internal	The instrument has 8GB of built-in storage space, after removing the system occupancy, the user can use about 6GB of space.
	External USB	Test setup files, screenshot graphics, record files
Keyboard Lock		Lockable front panel keys
Interfaces	USB HOST	2 USB HOST ports, can be connected to the mouse, keyboard, U disk can only be used one at a time
	USB DEVICE	Universal Serial Bus socket, small Class B (4 contact positions); compliant with USB TMC-USB 488 and USB2.0, female connector is used to connect an external controller.
	LAN	10/100M Ethernet, 8-pin, two speeds adaptive
	HANDLER	For Bin Staging Signal Output
	GPIB	Standard
	RS232C	Standard 9-pin, Crossed
	RS485	Standard
Power-on warm-up time		60 minutes.
Input Voltage		100-120VAC/198-242VAC selectable，47-63Hz
Power supply power		Not less than 130VA
Dimensions(WxHxD)mm		430x177x265
Weights		11kg

Accessories

Four-end clamp with card TH26005D
Short circuit TH26010
Kelvin test lead with box four-terminal insulation and lock TH26011BS

Impedance Analyzer Tonghui TH2848-02 2MHz

Datasheet
TH2848-02

Manual
TH2848-02