Near Field Probe Siglent SRF5030T

Descriptions

The SRF5030T near field probe set are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.They serve to locate and identify potential sources of interference within the building blocks of electronic assemblies. The probes act similar as wide bandwidth antennas, picking up radiated emissions from components, PCB traces, housing openings or gaps and from any other parts that could be emitting RF. They are usually connected to a spectrum analyser. Scanning the probe over the surface of a PCB assembly or housing quickly identifies locations which emit electromagnetic radiation. By changing to a probe with smaller size, the origination of the emissions can be further narrowed down

Additional applications are RF immunity tests by feeding a RF signal into the probe and radiating it into potentially susceptible circuit sections: Furthermore the probes can be used in the field of repair or debugging to track down issues in RF signal chains by contactless measurement of RF signal levels. One more application is non-invasive measurement of RF building blocks such as modulators or oscillators. Frequency, phase noise and spectral components can be measured in conjunction with a low noise preamplifier

Features

– Slim design for good access in between tightly spaced components
– Shielded loops to avoid picking up common mode noise, insensitive to the human hand
– Frequency range: 300 kHz-3 GHz, though they can be used well beyond 6 GHz
– SMB connectors to avoid twisting the RF cable when scanning DUTs
– Insulated with rubber coating