Sourcemeter Keithley 2651A High Power

Keithley 2651A High Power System SourceMeter Instrument

The high power Model 2651A is the newest addition to the Series 2600A family of System SourceMeter instruments. Specifically designed to characterize and test high power electronics, these source measurement unit (SMU) instruments can help you improve productivity in applications across the R&D, reliability, and production spectrums, including high brightness LEDs, power semiconductors, DC-DC converters, batteries, and other high power materials, components, modules, and subassemblies.

The Model 2651A, like every Series 2600A SourceMeter instrument, offers a highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meters. It can be used as a:

• Semiconductor characterization instrument
• V or I waveform generator
• V or I pulse generator
• Precision power supply
• True current source
• Digital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution)
• Precision electronic load

The Model 2651A can source or sink up to ±40V and ±50A.

Two Measurement Modes: Digitizing or Integrating

Precisely characterize transient and steady-state behavior, including rapidly changing thermal effects, with the two measurement modes in the Model 2651A. Each mode is defined by its independent analog-to-digital (A/D) converters.

The Digitizing Measurement mode enables 1µs per point measurements. Its 18-bit A/D converters allow you to precisely measure transient characteristics. For more accurate measurements, use its Integrating Measurement mode, which is based on 22-bit A/D converters. The Integrating measurement mode is provided in all Series 2600A instruments.

Two A/D converters are used with each measurement mode (one for current and the other for voltage), which run simultaneously for accurate source readback that does not sacrifice test throughput.

The dual digitizing A/D converters sample at up to 1µs/point, enabling full simultaneous characterization of both current and voltage waveforms. High Speed Pulsing

The Model 2651A minimizes the unwanted effects of self heating during tests by accurately sourcing and measuring pulses as short as 100µs. Additional control flexibility enables you to program the pulse width from 100µs to DC and the duty cycle from 1% to 100%. A single unit can pulse up to 50A; combine two units to pulse up to 100A.

Keithley's TSP and TSP-Link technology enables true SMU-per-pin testing without the power and/or channel limitations of a mainframe-based system. next-generation devices. Expansion Capabilities

Through TSP-Link ®  technology, multiple Model 2651As and other Series 2600A instruments can be combined to form a larger integrated system with up to 64 channels. Precision timing and tight channel synchronization are guaranteed with built-in 500ns trigger controllers. True SMU instrument-per-pin testing is assured with the fully isolated, independent channels of the SourceMeter instruments.

Also, when two Model 2651As are connected in parallel with TSP-Link technology, the current range is expanded from 50A to 100A. When two units are connected in series, the voltage range is expanded from 40V to 80V. Built-in intelligence simplifies testing by enabling the units to be addressed as a single instrument, thus creating an industry-best dynamic range (100A to 1pA). This  capability enables you to test a much wider range of power semiconductors and other devices.

Precision measurements to 50A (100A with two units) enable a more complete and accurate characterization.

1µV measurement resolution and current sourcing up to 50A (100A with two units) enable low-level Rds measurements to support next-generation devices. Standard Capabilities of Series 2600A Instruments

Each Model 2651A includes all the features and capabilities provided in the other Series 2600A instruments, such as:

• Ability to be used as either a bench-top I-V characterization tool or as a building block component of multiple-channel I-V test systems
• TSP Express software to quickly and easily perform common I-V tests without programming or installing software.
• ACS Basic Edition software for semiconductor component characterization (optional). ACS Basic now features a Trace mode for generating a suite of characteristic curves.
• Keithley's Test Script Processor (TSP ® ), which enables creation of custom user test scripts to further automate testing, and also supports the creation of programming sequences that allow the instrument to operate asynchronously without direct PC control.
• Parallel test execution and precision timing when multiple Series 2600A instruments are connected together in a system.
  LXI Class C compliance.
• 14 digital I/O lines for direct interaction with probe stations, component handlers, or other automation tools.
• USB port for extra data and test program storage via USB memory device