Microelectronics Teaching Experiment System Tonghui

Name: Microelectronics Teaching Experiment System Tonghui
Brand: Tonghui
SKU: BTHVDT
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Changzhou Tonghui Microelectronics Teaching Experiment System

>>> Conform to the development of science and technology and lead talent education

Technology is the primary productive force, and talent is the primary resource.
The primary task of education is to quickly improve the quality of talent training and adapt to the pace of development in the new era. From the needs of the industry, there is an urgent need to cultivate a large number of comprehensive talents who can carry out theoretical research, semiconductor design, master process processes and R&D management. This puts forward higher requirements for professional basic practical courses in higher education.
Tonghui Electronics has been focusing on the field of measurement and testing since its establishment. Combining its own measurement and testing experience in the fields of microelectronics and semiconductors, years of industry-university- research cooperation experience, and the requirements of upstream and downstream manufacturers for talent capabilities, a microelectronics experimental system was designed in a targeted manner. Implementing practice into teaching and introducing testing concepts into teaching links provide a new direction for practical teaching of microelectronics and semiconductors.

Basic features of microelectronics teaching platform

1. Rich experimental projects

The microelectronics teaching experiment system provides up to nine experimental projects, covering microelectronics, integrated circuit design, etc. These experimental projects are designed to help students gain a comprehensive understanding of the basic principles of microelectronics and methods of integrated circuit design.

2. Flexible experimental configuration

According to different teaching needs and experimental course settings, the microelectronics teaching experiment system supports a variety of different experimental configurations. Students can choose appropriate experimental projects according to their own interests and needs for personalized learning and practice.
The experimental platform adopts a modular design and can be configured arbitrarily according to different teaching needs, experimental courses, program budgets, etc.

3. Advanced experimental equipment

The microelectronics teaching experiment system uses advanced experimental equipment and technology, such as the latest technology products: semiconductor CV characteristic tester, digital oscilloscope, dual-channel digital source meter, signal source, etc. These equipment can provide students with real-life microelectronics design, manufacturing and testing environment, which will help students adapt to the microelectronics industry environment more quickly after graduation.

4. Easy-to-operate learning platform

The microelectronics teaching experiment system adopts an intuitive operation interface and friendly human-computer interaction design. The graphic teaching enables students to easily learn the basic principles and experimental operations of microelectronics, integrated circuits, and test instruments. At the same time, the experimental bench also provides detailed experimental steps and troubleshooting guides to help students solve problems encountered during the experiment.

Application

1. Schottky barrier characteristics and measurement of impurities

1-bo-thi-nghiem-do-dac-tinh-rao-can-schottky

Applicable courses	Purpose	Measuring instruments and equipment
Semiconductor device principles Fundamentals of Solid State Physics Semiconductor material basics Electronic thin film materials and devices	Understand the structure of Schottky diodes Understand the formation principle of Schottky barrier junction Understand the rectification characteristics and barrier capacitance of Schottky diodes Learn to measure the C-V characteristics of Schottky diodes Learn to calculate impurity concentrations	TH511 E Semiconductor Device CV Characteristics Analyzer TH1992B Precision Source/Measure Unit TH26011D DC bias fixture Semiconductor component experiment box

2. Working principle and measurement of resistive sensors

Applicable courses	Purpose	Measuring instruments and equipment
Silicon photonics test experiment	Understand the principles of various resistive sensors Master the LCR impedance measurement method	TH511E Semiconductor Device CV Characteristics Analyzer

3. Field effect transistor DC parameter test

6-bo-thi-nghiem-kiem-tra-tham-so-dc-transistor

Applicable courses	Purpose	Measuring instruments and equipment
Semiconductor device principles Fundamentals of Solid State Physics Semiconductor material basics Analog integrated circuit	Master the basic structure and working principle of MOSFET Master the definition of each parameter of MOSFET Master the method of measuring MOSFET transfer characteristic curve and output characteristic curve	TH1992B Precision Source/Measure Unit Semiconductor component experiment box DC characteristic test software

4. PN junction DC characteristics test and PN junction parameter temperature change test

Applicable courses

Purpose

Measuring instruments and equipment

Semiconductor device principles
Fundamentals of Solid State Physics
Semiconductor material basics

Understand the working principle of Zener diodes
Master the volt-ampere characteristics and parameter definitions of Zener diodes
Learn to use TH1992B source meter and thermostat to test diode temperature characteristics

TH1992B Precision Source/Measure Unit
temperate box
Semiconductor component experiment box

5. Measurement of DC parameters of bipolar transistors

2-bo-thi-nghiem-do-luong-tham-so-dc-cua-transistor-luong-cuc

Applicable courses

Purpose

Measuring instruments and equipment

Semiconductor device principles
Semiconductor material basics
Analog integrated circuit

Master the basic structure and definition of main parameters of bipolar transistors
Master the method of measuring the input characteristics and output characteristic curves of bipolar transistors using source meters
Understand common pitfalls in bipolar transistor output characteristics and their causes

TH1992B Precision Source/Measure Unit
Semiconductor component experiment box

6. MOS device static characteristics test and analysis

5-bo-thi-nghiem-kiem-tra-dac-tinh-tinh-dien-mosfet

Applicable courses	Purpose	Measuring instruments and equipment
Semiconductor device principles Semiconductor material basics Analog integrated circuit	Master the measurement methods of MOFFET saturation leakage current loss, threshold voltage VTH, transconductance, etc. Master the method of measuring MOSFET output characteristic curve	TH1992B Precision Source/Measure Unit Semiconductor component experiment box DC characteristic test software

7. MOS device CV characteristic test

4-bo-thi-nghiem-kiem-tra-dac-tinh-CV-mosfet

Applicable courses	Purpose	Measuring instruments and equipment
Semiconductor device principles Semiconductor material basics Analog	Understand the dynamic parameters and parasitic capacitance of field effect transistors Be familiar with the definitions and hazards of Ciss, Coss, Crss, etc. in dynamic parameters Master the measurement of Ciss, Coss, Crss, etc. in dynamic integrated circuit parameters Master Ciss, Coss, and Crss curve scans in dynamic parameters	TH511E Semiconductor Device CV Characteristics Analyzer Semiconductor component experiment box

8. MOS device dynamic switching characteristics test

3-bo-thi-nghiem-kiem-tra-dac-tinh-chuyen-mach-cua-mosfet

Applicable courses	Purpose	Measuring instruments and equipment
Semiconductor device principles Semiconductor material basics Analog integrated circuit	Master the MOSFET turn-on process Master the definition of MOSFET switching time Familiar with the use of function signal generators Familiar with the use of digital storage oscilloscopes	Digital storage oscilloscope Signal generator Dynamic switching characteristics analysis software Semiconductor component experiment box

9. Integrated operational amplifier characteristic analysis and test (upper and lower)

8-bo-thi-nghiem-phan-tich-khuech-dai-tich-hop

Applicable courses	Purpose	Measuring instruments and equipment
Semiconductor device principles Semiconductor material basics digital integrated circuit Analog integrated circuit	Understand the concept of integrated circuits and be familiar with the structure of integrated operational amplifiers Be familiar with various parameter concepts in integrated circuit amplifiers Master the parameter measurement methods of integrated circuit amplifiers	TH1992B Precision Source/Measure Unit TH1963A digital multimeter digital storage oscilloscope function signal generator Integrated circuit experiment box

Product Lists

STT	Product Name	Brand	Qual.
1	TH511E power semiconductor device CV characteristic analyzer	Tonghui/Techmize	1
2	TH1992B Precision Source/Measure Unit SMU	Tonghui/Techmize	1
3	Digital Multimeter TH1963A (Other Digital Multimeter )	Option	1
4	TH26011D DC bias fixture	Tonghui/Techmize	1
5	Oscilloscope SDS814X 100MHz 4 kênh (Other Oscilloscope )	Option	1
6	Waveform Generator SDG1032X Plus (Other Waveform Generator )	Option	1
7	Semiconductor Component Experiment Box	Tonghui/Techmize	1
8	Integrated circuit experiment box	Tonghui/Techmize	1
9	Temperature box	Option	1
10	Software	Tonghui/Techmize	1

Name	Theory course name	Curriculum tructure
Schottky Barrier Characteristics and Measurement of Impurities	Semiconductor device principles Fundamentals of Solid State Physics Semiconductor material basics Electronic thin film materials and devices	Semiconductor Physics
How resistive sensors work and measure	Silicon photonics test experiment	Semiconductor Physics
Field effect transistor DC parameter test	Semiconductor device principles Fundamentals of Solid State Physics Semiconductor material basics Analog integrated circuit	Semiconductor device Physics Semiconductor device reliability
PN junction DC characteristics test and PN junction parameters variable temperature test	Semiconductor device principles Fundamentals of Solid State Physics Semiconductor material basics
Measurement of DC Parameters of Bipolar Transistors	Semiconductor device principles Semiconductor material basics Analog integrated circuit
Test analysis of static characteristics of MOS devices	Semiconductor device principles Semiconductor material basics Analog integrated circuit	Semiconductor device Physics Semiconductor device reliability Integrated circuit principles and design
MOS device dynamic switching characteristics test	Semiconductor device principles Semiconductor material basics Analog integrated circuit
Integrated operational amplifier characteristic analysis test (upper and lower)	Semiconductor device principles Semiconductor material basics digital integrated circuit