Test system for digital sensors Spektra S-TEST Lab AHF
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Specification
Data is being updated
S-TEST Lab AHF
Based on our high-frequency exciters SE-09 and SE-11, the S-TEST Lab AHF systems are a perfect fit for calibration and characterization of MEMS, digital sensors and other small components. Those typical systems were especially designed for system testing at high frequencies.
- Force rating 100 N
- Frequency range: SE-09: 3 Hz … 50 (95) kHz / SE-11: 1 kHz … 50 (95) kHz
- Sample rate 120/200 kS/s
- 24 Bit resolution
- SE-11 eligible for climate chamber
- Remote control for climate chamber
Software highlights
- Wide range of functions for R&D
- Sweep, Dwell, manual mode, script operation and remote control
- Spectral analysis and distortion factor measurement
- Supports laser vibrometer
- Spectral RMS measurement
- Extensive display functions
- Powerful filters
Accessories
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