Test system for digital sensors Spektra S-TEST Lab AHF

Test system for digital sensors Spektra S-TEST Lab AHF

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S-TEST Lab AHF
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Specification

Data is being updated

S-TEST Lab AHF

Based on our high-frequency exciters SE-09 and SE-11, the S-TEST Lab AHF systems are a perfect fit for calibration and characterization of MEMS, digital sensors and other small components. Those typical systems were especially designed for system testing at high frequencies.

  • Force rating 100 N
  • Frequency range: SE-09: 3 Hz … 50 (95) kHz / SE-11: 1 kHz … 50 (95) kHz
  • Sample rate 120/200 kS/s
  • 24 Bit resolution
  • SE-11 eligible for climate chamber
  • Remote control for climate chamber

Software highlights

  • Wide range of functions for R&D
  • Sweep, Dwell, manual mode, script operation and remote control
  • Spectral analysis and distortion factor measurement
  • Supports laser vibrometer
  • Spectral RMS measurement
  • Extensive display functions
  • Powerful filters

Accessories

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