TH2638 Precision Capacitance Meter

TH2638 Precision Capacitance Meter

SKU:
TH2638
Brand:
Warranty:
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Price: Contact
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Specification

Test Parameters: Cp-D, Cp-Q, Cp-Rp, Cp-G, Cs-D, Cs-Q, Cs-Rs

Test Signal:
Frequency
Permitted frequency: 100Hz,120Hz, 1kHz,10kHz,100kHz,1MHz,1MHz±1%,1MHz±2%
Accuracy: ±0.02%

Level
Range: 0.1V-1V
Resolution: 0.01V
Accuracy: ±5%

Output Mode: Continuous or synchronous

Signal Source 
Delay Range: 0-1s
Resolution: 0.1ms

Signal Level Compensation 
100/120Hz: 220μF, 470μF, 1mF range
1kHz: 22μF, 47μF, 100μF range
 

Brief Introduction

– TH2638 series is a new precision capacitance meter with higher test frequency. With small size and portable appearance, it is convenient for use on the shelves. With basic accuracy of ±0.07%, loss accuracy of 0.0005, test frequency up to 1MHz, 4.3-inch LCD screen, selectable Chinese-English operation interface, TH2638 series is easy to operate and provide fast and reliable test for ceramic capacitor production. Also, it can test all kinds of capacitors from low value to high value. The results of testing one capacitor for several times are quite stable and accurate, even for lower value capacitors. The tester is compatible with SCPI command set, and configured with manipulator and scanner interface, the scanner interface can scan the open/short/ load error calibration in each channel, 256 channels at most. In low frequency, there is signal level compensation function. When the impedance is very small, the internal resistance in signal source and test cable will cause the voltage on terminal of DUT lower than the set range, then this function will adjust the level to the set range.

– There is an additional inspection function for failed contactespecially for production lines, which can detect the failed contact between DUTs with tester and no extra time is needed to carry out this operation. It keeps the same signal source function as the real test, where there is the real test, the test signal can be generated in DUT, and there is no any test signal when connect and disconnect the DUT, thus it will reduce the damage to the fixture or test point when there is big current in failed contact. When the test frequency is 1MHz, the test frequency can be set Rel (offset value is ±1%,±2%). In array capacitor test, this function can eliminate the noise between adjacent terminals and reduce the difference of test results. There is feed box with tester, so user can set 9 boxes based on the result of C-D/Q/R/Q to find out the pass and fail products and then put into different boxes.

Performance characteristics

– Test Frequency: Max. 1MHz
– Basic test accuracy: ±0.07%
– Loss factor: ±0.0005
– Test speed: Max 2.3ms
– 4.5 inch TFT LCD display
– Selectable Chinese and English operation interface
– V, I test signal level monitor function
– Low impedance measurement, signal level, compensation function
– Built-in 11-bin comparator
– Internal file storage and externam U disk storage 
– Test data can be directly saved in U disk
– Screen shot can be saved in U disk
– Compatible with SCPI commands
– RS232C, USB CDC, LAN, HANDLER, GPIB interfaces
– Manipulator interface and scanner interface
– Contact inspection function
– Synchronizing signal source
– Offset function in 1MHz test frequency (±1, ±2%)

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