Tektronix DMM7512 Dual Channel 7½-Digit Sampling Multimeter

Tektronix DMM7512 Dual Channel 7½-Digit Sampling Multimeter

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DMM7512
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Specification

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Description

The DMM7512 Dual Channel 7½-digit Sampling Multimeter combines two full-function, high accuracy and high sampling speed DMMs into a compact 1U high, full rack wide form factor chassis. The compact chassis saves rack space in high-instrument density, test systems. The small size does not compromise measurement performance. Each DMM has identical functionality, and both are entirely independent of each other. The DMMs achieve a basic, one-year accuracy as low as 14 ppm for DC volts, 24 ppm for resistance, and 60 ppm for DC current. Sensitivities of 10 nV, 0.1 µΩ, and 1 pA ensure high quality, high resolution measurements on very small signals. In addition, each DMM has a wide range of functionality including voltage digitizing, current digitizing, and temperature measurements with resistance temperature detectors (RTDs), thermistors, and thermocouples. With dual channel capability, fast signal sampling, high speed data transfer rates reaching up to 100,000 measurements/s, and internal execution of program test scripts, the DMM7512 reduces space and reduces test time in automated test systems

Features:

Two high-precision, 7½-digit DMMs in a 1U high, full rack width chassis
• No space requirements between instruments minimizes rack space
• Capture waveforms or identify transients with two 1 Msample/s 18-bit digitizers
• Trigger a waveform measurement on a signal level, a rising or falling edge, a window, or a digital trigger
• Store up to 27.5M timestamped readings on a waveform
• Basic one-year DC Voltage accuracy as low as 14 ppm
• 10 nV, 0.1 µΩ, and 1 pA sensitivities for making high resolution low level measurements such as measurements of portable device sleep currents
• High accuracy, low resistance measurements with offset compensated ohms, four-wire measurement, and dry circuit functions
• Auto-calibration improves accuracy and stability by minimizing temperature and time drift
• USBTMC-compliant and LAN LXI-compliant interfaces
• Reduce test time by executing test scripts with the Embedded Test Script Processor, which saves PC command communication overhead
• Tight synchronization between the two DMMs using TSP-Link® communication
• Reduce life cycle costs with a two-year calibration interval

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