SigOFIT Optical-fiber Isolated Probe Micsig MOIP03P

Description

Based on exclusive SigOFIT™ technology, the SigOFIT optical-fiber isolated probe has extremely high CMRR and isolation voltage, help to unveil the whole truth of the signal within bandwidth.

Features

Present True Signal
SigOFIT probe has highest common mode rejection ratio, or CMRR, up to 128dB at 100MHz, over 100dB at 1GHz. It’s the ultimate referee of signal fidelity measured by other voltage probes.

Highest Accuracy
As the ultimate referee of signal fidelity, SigOFIT optical-fiber isolated probe delivers highest test accuracy. It has excellent amplitude-frequency characteristics, DC gain accuracy ≤1%, while noise ≤ 0.45mVrms. Zero drift<0.1% (works 5 mins later), gain drift also <1%.

Best Probe for Third-Gen Semiconductor
SiC & GaN device can switch high voltages in a few nanoseconds, the signal may have high-energy high-frequency harmonics.
Even at the highest bandwidth, the SigOFIT probe still have nearly 100dB CMRR, perfectly suppressed the oscillation caused by high-frequency common-mode noise, no redundant components. It’s the best choice for 3rd-gen semiconductor test & measurement.

Safe to Test GaN
The test leads of SigOFIT probe are short and with coaxial cable transmission, has less than 2.5pF input capacitance, very safe to test GaN.
* When the working parameters of the device are already in the critical state of explosive, there will be nearly 2.5pF more capacitance added when connected to the DUT, safety hence is not guaranteed.

Wide Measurement Range
Unlike traditional differential probes can only test high-voltage signals, SigOFIT probe can be used with different attenuator tips to test differential mode signals from ±0.1V to ±5000V, achieve full-range output and very high signal-to-noise ratio.

Efficient & Affordable
Fastest response, can be tested immediately after power-on; AutoZero completed in less than 1 second, ensures accurate signal output in real time.

Applications

* Design of motor drive, power converter, electronic ballast

* Design of GaN, SiC, IGBT Half/Full bridge devices

* Design of inverter, UPS and switching power supply

* Safety test for high voltage, high bandwidth applications

* Power device evaluation

* Current shunt measurements

* EMI & ESD troubleshooting

* Floating measurements