Spring-loaded test probe GKS-075 291 064 A 2000
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Specification
Data is being updated
Technical data GKS-075 288 120 A 2000
- Well-established test probes for contacting PCBs
- For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available.

| Product group : | ICT / FCT (in-circuit test and function test |
|---|---|
| Sub-product group : | Standard stroke test probe |
| Series : | GKS-075 |
| Grid : | 1.91 mm |
| Contacting from : | Pad, via |
| Magnetic : | Yes |
| Installation type : | Plug-in |
| Quick-exchange system : | Yes |
| Adjustable installation height : | No |
| Non-rotating : | No |
| Compatible receptacle(s) : | KS-075 |
| Min. temperature : | - 40 °C |
| Max. temperature : | + 80 °C |
| RoHS-compliant : | RoHS-3;6a |
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