- Description
- Data
Description
Performance Characteristics
– Number of test PIN: 24
– Frequency: 20Hz-200kHz, 15025 points
– Signal Level: 10mV-2Vrms, 100μA – 20mArms | 20mV-1Vrms, 200μA – 10mArms
– Test speed: max. 40ms
– 4.3 inch TFT LCD Display
– Brand new interface design
– Built-in 0 – ±5V/50mA bias source
– TH2832XA: LCR + transformer test system
– TH2832XB: transformer test system
– TH2832XC: transformeer test system
– Discrete passive component (L, C, R) mutipass scan test
– Switch transformer scan test
– Network transformer scan test
– Relay drive coil, contact resistance multi-channel scan test
– Multi-channel DCR scan test
– Singel parameter loop test
– Scan fixture relay action times review
– Flexible deviation deduction method
– self-test scanning fixture relays
– Storage: internal: 100 groups of settings file to save, U disk: large capacity of configuration, CSV format test data and GIF format images
– Firmware update through U disk
– Optional PC-level instrument test setup file programming capability
– Parameter setting file is compatibe with TH2829x-24
– RS-232, USB DEVICE interface
– Work with TH1231 24-pin transformer scanning fixture
Specifications
Model | TH2832XB | |||
Number of Test Pin | 24 | |||
Test Signal Frequency | 20Hz-200kHz, 15025 points in total. | |||
Display | 4.3 inch TFT LCD 272*480 | |||
Transformer Test Parameter | Turn ratio, turs, phase, L, C, Lk, Q, ACR, DCR, Balance, Pin short. | |||
LCR Test Parameter | No LCR function | |||
Basic Accuracy | LCRZ | —– | ||
DCR, Turn ratio | 0.5% | |||
Signal Source Output Impedance | 30Ω, 100Ω selectable. | |||
Test Speed (≥10 kHz) | Fast: 40ms, Med: 125ms, Slow: 370ms. | |||
AC Signal Level | 10mV – 2Vrms, 100μA – 20mArms. | |||
DC Bias Voltage Source | 0V – ± 5V, 0mA –±50mA. | |||
Comparator Function | 10-bin sorting, PASS/FAIL indicator, count function | |||
Memory | 100 groups of LCRZ setting file,100 groups of transformer scan set file, 10 groups of gif file. |